MC9S12E32CFU FREESCALE [Freescale Semiconductor, Inc], MC9S12E32CFU Datasheet - Page 583

• Manufacturer Part Number: MC9S12E32CFU
• Description: HCS12 Microcontrollers
• Manufacturer: FREESCALE [Freescale Semiconductor, Inc]

A.4.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1
2
3
Freescale Semiconductor
Conditions are shown in
Num C
T
application.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature can
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40 C
(0 C
NVM Reliability
T
J
T
J
140 C)
Table A-4
0 C)
unless otherwise noted
Rating
Table A-15. NVM Reliability Characteristics
Javg
MC9S12E128 Data Sheet, Rev. 1.07
Javg
Flash Reliability Characteristics
85 C
85 C
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
1
Appendix A Electrical Characteristics
100,000
100
100
Typ
—
2
2
3
Max
—
—
—
—
Cycles
Years
Unit
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