STEVAL-IFW001V1 STMicroelectronics, STEVAL-IFW001V1 Datasheet - Page 72
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STEVAL-IFW001V1
Manufacturer Part Number
STEVAL-IFW001V1
Description
BOARD EVAL BASED ON STR912FA
Manufacturer
STMicroelectronics
Datasheets
1.STEVAL-IFW001V1.pdf
(102 pages)
2.STEVAL-IFW001V1.pdf
(9 pages)
3.STEVAL-IFW001V1.pdf
(7 pages)
Specifications of STEVAL-IFW001V1
Design Resources
STEVAL-IFW001V1 Gerber Files STEVAL-IFW001V1 Schematic STEVAL-IFW001V1 Bill of Material
Main Purpose
Interface, Ethernet
Embedded
Yes, MCU, 32-Bit
Utilized Ic / Part
E-STE101P, STR912FAW44
Primary Attributes
Dual Ethernet Transceivers for Full Duplex Communication
Secondary Attributes
Up to 32 MII Addresses, UART, I2C, SPI, with RJ45 Connectors
Silicon Manufacturer
ST Micro
Core Architecture
ARM
Core Sub-architecture
ARM9
Silicon Core Number
STR9
Silicon Family Name
STR91x
For Use With
497-8263 - BOARD EXTENSION STEVAL-IFW001V1
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-8262
Electrical characteristics
7.9
7.9.1
Table 27.
1. Data based on characterization results, not tested in production.
72/102
Symbol
V
V
FESD
FFTB
Voltage limits to be applied on
any I/O pin to induce a functional
disturbance
Fast transient voltage burst limits
to be applied through 100pF on
V
functional disturbance
DD
EMS data
EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Functional EMS (electro magnetic susceptibility)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electro magnetic events until a failure occurs (indicated by the
LEDs).
●
●
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
and V
ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the
device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2
standard.
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to V
and V
conforms with the IEC 1000-4-4 standard.
DDQ
Parameter
SS
pins to induce a
through a 100pF capacitor, until a functional disturbance occurs. This test
V
f
V
f
conforms to IEC 1000-4-4
OSC
OSC
DD
DD
Doc ID 13495 Rev 6
=1.8 V, V
= 1.8 V, V
/f
/f
CPUCLK
CPUCLK
DDQ
= 4 MHz/96 MHz PLL
= 4 MHz/96 MHz PLL
DDQ
Conditions
= 3.3 V, T
= 3.3 V, T
A
A
= +25 °C,
= +25 °C,
Criteria
Severity/
1B
4A
STR91xFAxxx
(1)
DD,
V
Unit
DDQ
kV