AT32UC3A3128 Atmel Corporation, AT32UC3A3128 Datasheet - Page 40

• Manufacturer Part Number: AT32UC3A3128
• Manufacturer: Atmel Corporation

Specifications of AT32UC3A3128

• Flash (kbytes): 128 Kbytes
• Pin Count: 144
• Max. Operating Frequency: 66 MHz
• Cpu: 32-bit AVR
• # Of Touch Channels: 32
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 110
• Ext Interrupts: 110
• Usb Transceiver: 1
• Usb Speed: Hi-Speed
• Usb Interface: Device + OTG
• Spi: 6
• Twi (i2c): 2
• Uart: 4
• Lin: 4
• Ssc: 1
• Sd / Emmc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Dac Channels: 2
• Dac Resolution (bits): 16
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 128
• Self Program Memory: YES
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.0 to 3.6
• Operating Voltage (vcc): 3.0 to 3.6
• Fpu: No
• Mpu / Mmu: Yes / No
• Timers: 6
• Output Compare Channels: 18
• Input Capture Channels: 12
• Pwm Channels: 12
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

7. Electrical Characteristics
7.1
32072G–11/2011
Operating Temperature.................................... -40°C to +85°C
Storage Temperature ..................................... -60°C to +150°C
Voltage on Input Pin
with respect to Ground ........................................-0.3V to 3.6V
Maximum Operating Voltage (VDDCORE) ..................... 1.95V
Maximum Operating Voltage (VDDIO).............................. 3.6V
Total DC Output Current on all I/O Pin
for TQFP144 package ................................................. 370 mA
for TFBGA144 package ............................................... 370 mA
Absolute Maximum Ratings*
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
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