MC9S08EL16CTJ Freescale Semiconductor, MC9S08EL16CTJ Datasheet - Page 352

• Manufacturer Part Number: MC9S08EL16CTJ
• Description: MCU 16KB FLASH SLIC 20TSSOP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08EL16CTJ

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, LIN, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 16
• Program Memory Size: 16KB (16K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 512 x 8
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 12x10b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 20-TSSOP
• Processor Series: S08EL
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 1 KB
• Interface Type: SCI, SPI, I2C, SLIC
• Maximum Clock Frequency: 200 KHz
• Number Of Programmable I/os: 16
• Number Of Timers: 2
• Operating Supply Voltage: 5.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08EL32AUTO, DEMO9S08EL32
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 12 Channel
• For Use With: DEMO9S08EL32 - BOARD DEMO FOR 9S08 EL MCUDEMO9S08EL32AUTO - DEMO BOARD EL32 AUTO
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Appendix A Electrical Characteristics
A.14.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
Table
1
The susceptibility performance classification is described in
354
1
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Data based on qualification test results.
Result
A-18.
A
B
C
D
E
Parameter
Conducted Transient Susceptibility
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
MC9S08EL32 Series and MC9S08SL16 Series Data Sheet, Rev. 3
Table A-19. Susceptibility Performance Classification
Table A-18. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Symbol
V
CS_EFT
package type
Conditions
V
T
28 TSSOP
A
DD
= +25
= 5.0V
Performance Criteria
o
C
Table
4MHz crystal
20MHz bus
f
OSC
/f
A-19.
BUS
Result
C
D
A
B
E
Freescale Semiconductor
±300 – ±3700
Amplitude
−3800
(Min)
N/A
N/A
N/A
1
Unit
V