ML610Q409-NNNTBZ03A7 Rohm Semiconductor, ML610Q409-NNNTBZ03A7 Datasheet - Page 343

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ML610Q409-NNNTBZ03A7

Manufacturer Part Number
ML610Q409-NNNTBZ03A7
Description
MCU 8BIT 16K FLASH 4CH 100-TQFP
Manufacturer
Rohm Semiconductor
Series
-r

Specifications of ML610Q409-NNNTBZ03A7

Core Processor
nX-U8/100
Core Size
8-Bit
Speed
2MHz
Connectivity
SSP, UART/USART
Peripherals
LCD, Melody Driver, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
-
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
1.25 V ~ 3.6 V
Data Converters
A/D 2x16b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 70°C
Package / Case
100-TFQFP
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ML610Q409-NNNTBZ03A7
Manufacturer:
Rohm Semiconductor
Quantity:
10 000
Chapter 25 Mask Type Emulation Function
25.3 Notice for the Software Program Development
25.3.1 Notice for the Mask ROM Version Mode Setting Data
When developing Mask ROM version (ML610401/ML610402/ML610403/ML610404/ML610405/ML610406) program with
MTP version ML610Q407, Mask ROM version mode data must be set in the test region of the program memory.
If the startup file is not used, put unused address region and test region program shown below into the program. Put these
unused address region and test region program into the program of MTP version(ML610Q407/ML610Q408/ML610Q409) and
Mask ROM version(ML610407/ML610408/ML610409), too.
;---------------------------------------------------------------
;
;---------------------------------------------------------------
;---------------------------------------------------------------
;
;---------------------------------------------------------------
;---------------------------------------------------------------
;
;---------------------------------------------------------------
Unused address region and test region program for ML610401 (low speed clock stop detection reset enable
setting)
Filling the extra area at code memory (for ML610Q401)
Filling the Test area at code memory (for ML610Q401)
Keeping the Mirror area (for ML610Q401)
cseg at 01700h
dw 1280h
cseg at 03c00h
dw 0f4h
cseg at 03de8h
dw
dw
dw
dw
cseg at 03df0h
dw 8h
tseg #8 at 00000h
ds
03e00h
04010h
02b48h
000f0h
0a55ah
DUP 0ffffh
DUP 0ffffh ;
DUP 0ffffh
;Target configuration data 3
;Target configuration data 4
;Target configuration data 1
;Target configuration data 2
25-2

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