SAM3U4E Atmel Corporation, SAM3U4E Datasheet - Page 991
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SAM3U4E
Manufacturer Part Number
SAM3U4E
Description
Manufacturer
Atmel Corporation
Specifications of SAM3U4E
Flash (kbytes)
256 Kbytes
Pin Count
144
Max. Operating Frequency
96 MHz
Cpu
Cortex-M3
# Of Touch Channels
57
Hardware Qtouch Acquisition
No
Max I/o Pins
96
Ext Interrupts
96
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
5
Twi (i2c)
2
Uart
5
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
50
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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Note:
6430E–ATARM–29-Aug-11
6430E–ATARM–29-Aug-11
For the Test mode, Test_SE0_NAK (see Universal Serial Bus Specification, Revision 2.0: 7.1.20, Test Mode Support). Force the
device in High Speed mode, and configure a bulk-type endpoint. Do not fill this endpoint for sending NAK to the host.
Upon command, a port’s transceiver must enter the High Speed receive mode and remain in that mode until the exit action is
taken. This enables the testing of output impedance, low level output voltage and loading characteristics. In addition, while in
this mode, upstream facing ports (and only upstream facing ports) must respond to any IN token packet with a NAK handshake
(only if the packet CRC is determined to be correct) within the normal allowed device response time. This enables testing of the
device squelch level circuitry and, additionally, provides a general purpose stimulus/response test for basic functional testing.
SAM3U Series
SAM3U Series
991
991
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