SAM7X128 Atmel Corporation, SAM7X128 Datasheet - Page 45

• Manufacturer Part Number: SAM7X128
• Manufacturer: Atmel Corporation

Specifications of SAM7X128

• Flash (kbytes): 128 Kbytes
• Pin Count: 100
• Max. Operating Frequency: 55 MHz
• Cpu: ARM7TDMI
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 62
• Ext Interrupts: 62
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device
• Spi: 2
• Twi (i2c): 1
• Uart: 3
• Can: 1
• Ssc: 1
• Ethernet: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.3
• Operating Voltage (vcc): 3.0 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12. Debug and Test Features
12.1
12.2
6120I–ATARM–06-Apr-11
Description
Block Diagram
The SAM7X Series features a number of complementary debug and test capabilities. A common
JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as down-
loading code and single-stepping through programs. The Debug Unit provides a two-pin UART
that can be used to upload an application into internal SRAM. It manages the interrupt handling
of the internal COMMTX and COMMRX signals that trace the activity of the Debug Communica-
tion Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
TAP
Reset
and
Test
SAM7X512/256/128
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
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