SAM7X128 Atmel Corporation, SAM7X128 Datasheet - Page 47

• Manufacturer Part Number: SAM7X128
• Manufacturer: Atmel Corporation

Specifications of SAM7X128

• Flash (kbytes): 128 Kbytes
• Pin Count: 100
• Max. Operating Frequency: 55 MHz
• Cpu: ARM7TDMI
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 62
• Ext Interrupts: 62
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device
• Spi: 2
• Twi (i2c): 1
• Uart: 3
• Can: 1
• Ssc: 1
• Ethernet: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.3
• Operating Voltage (vcc): 3.0 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12.3.2
12.4
6120I–ATARM–06-Apr-11
Debug and Test Pin Description
Test Environment
Figure 12-3
ter. In this example, the “board in test” is designed using a number of JTAG-compliant devices.
These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
shows a test environment example. Test vectors are sent and interpreted by the tes-
Debug and Test Pin List
AT91SAM7Xxx-based Application Board In Test
Connector
ICE/JTAG
AT91SAM7Xxx
Interface
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
Chip n
ICE and JTAG
Test Adaptor
Debug Unit
Reset/Test
Chip 2
Chip 1
SAM7X512/256/128
Tester
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
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