SAM7X256 Atmel Corporation, SAM7X256 Datasheet - Page 48

• Manufacturer Part Number: SAM7X256
• Manufacturer: Atmel Corporation

Specifications of SAM7X256

• Flash (kbytes): 256 Kbytes
• Pin Count: 100
• Max. Operating Frequency: 55 MHz
• Cpu: ARM7TDMI
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 62
• Ext Interrupts: 62
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device
• Spi: 2
• Twi (i2c): 1
• Uart: 3
• Can: 1
• Ssc: 1
• Ethernet: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 64
• Self Program Memory: NO
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.3
• Operating Voltage (vcc): 3.0 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12.5
12.5.1
12.5.2
12.5.3
12.5.4
48
Functional Description
SAM7X512/256/128
Test Pin
EmbeddedICE
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
™
One dedicated pin, TST, is used to define the device operating mode. The user must make sure
that this pin is tied at low level to ensure normal operating conditions. Other values associated
with this pin are reserved for manufacturing test.
The ARM7TDMI EmbeddedICE is supported via the ICE/JTAG port. The internal state of the
ARM7TDMI is examined through an ICE/JTAG port.
The ARM7TDMI processor contains hardware extensions for advanced debugging features:
There are three scan chains inside the ARM7TDMI processor that support testing, debugging,
and programming of the EmbeddedICE. The scan chains are controlled by the ICE/JTAG port.
EmbeddedICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the EmbeddedICE, see the ARM7TDMI (Rev4) Technical Reference Man-
ual (DDI0210B).
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel. The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The SAM7X512 Debug Unit Chip ID value is 0x275C 0A40 on 32-bit width.
The SAM7X256 Debug Unit Chip ID value is 0x275B 0940 on 32-bit width.
The SAM7X128 Debug Unit Chip ID value is 0x275A 0740 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
(Embedded In-circuit Emulator)
• In halt mode, a store-multiple (STM) can be inserted into the instruction pipeline. This exports
• In monitor mode, the JTAG interface is used to transfer data between the debugger and a
the contents of the ARM7TDMI registers. This data can be serially shifted out without
affecting the rest of the system.
simple monitor program running on the ARM7TDMI processor.
6120I–ATARM–06-Apr-11