EP1AGX ALTERA [Altera Corporation], EP1AGX Datasheet - Page 120

• Manufacturer Part Number: EP1AGX
• Description: Section I. Arria GX Device Data Sheet
• Manufacturer: ALTERA [Altera Corporation]

3–8
Automated Single Event Upset (SEU) Detection
Custom-Built Circuitry
Software Interface
Arria GX Device Handbook, Volume 1
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For more information about Arria GX PLLs, refer to the
chapter.
Arria GX devices offer on-chip circuitry for automated checking of single event upset
(SEU) detection. Some applications that require the device to operate error free at high
elevations or in close proximity to Earth’s North or South Pole requires periodic
checks to ensure continued data integrity. The error detection cyclic redundancy
check (CRC) feature controlled by the Device and Pin Options dialog box in the
Quartus II software uses a 32-bit CRC circuit to ensure data reliability and is one of
the best options for mitigating SEU.
You can implement the error detection CRC feature with existing circuitry in Arria GX
devices, eliminating the need for external logic. Arria GX devices compute CRC
during configuration. The Arria GX device checks the computed-CRC against an
automatically computed CRC during normal operation. The CRC_ERROR pin reports
a soft error when configuration SRAM data is corrupted, triggering device
reconfiguration.
Dedicated circuitry is built into Arria GX devices to automatically perform error
detection. This circuitry constantly checks for errors in the configuration SRAM cells
while the device is in user mode. You can monitor one external pin for the error and
use it to trigger a reconfiguration cycle. You can select the desired time between
checks by adjusting a built-in clock divider.
Beginning with version 7.1 of the Quartus II software, you can turn on the automated
error detection CRC feature in the Device and Pin Options dialog box. This dialog
box allows you to enable the feature and set the internal frequency of the CRC
between 400 kHz to 50 MHz. This controls the rate that the CRC circuitry verifies the
internal configuration SRAM bits in the Arria GX FPGA.
For more information about CRC, refer to
FPGAs.
AN 357: Error Detection Using CRC in Altera
Automated Single Event Upset (SEU) Detection
PLLs in Arria GX Devices
© December 2009 Altera Corporation
Chapter 3: Configuration and Testing