E28F016XS20 INTEL [Intel Corporation], E28F016XS20 Datasheet - Page 26

• Manufacturer Part Number: E28F016XS20
• Description: 16-MBIT (1 MBIT x 16, 2 MBIT x 8) SYNCHRONOUS FLASH MEMORY
• Manufacturer: INTEL [Intel Corporation]

28F016XS FLASH MEMORY
5.3
AC test inputs are driven at V
(2.0 VTTL) and V
AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
NOTES:
1.
2.
26
Testing characteristics for 28F016XS-20 at 5V V
Testing characteristics for 28F016XS-15 at 5V V
Transient Input/Output Reference Waveforms
0.45
0.0
3.0
2.4
IL
Figure 8. Transient Input/Output Reference Waveform (V
Figure 9. Transient Input/Output Reference Waveform (V
(0.8 VTTL). Output timing ends at V
INPUT
INPUT
OH
High Speed Reference Waveform
(2.4 VTTL) for a Logic “1” and V
for Standard Testing Configuration
1.5
2.0
0.8
CC
CC
IH
.
and 28F016XS-20/28F016XS-25 at 3.3V V
and V
TEST POINTS
TEST POINTS
IL
OL
. Input rise and fall times (10% to 90%) <10 ns.
(0.45 VTTL) for a Logic “0.” Input timing begins at V
(2)
(V
CC
= 5.0V ± 5%)
(1)
CC
CC
= 5.0V ± 5%)
= 3.3V ± 5%)
1.5
2.0
0.8
CC
OUTPUT
.
OUTPUT
IH
0532_07
0532_08