ATMEGA169-16AI SL710 Atmel, ATMEGA169-16AI SL710 Datasheet - Page 244

IC AVR MCU 16K 16MHZ IND 64TQFP

ATMEGA169-16AI SL710

Manufacturer Part Number
ATMEGA169-16AI SL710
Description
IC AVR MCU 16K 16MHZ IND 64TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA169-16AI SL710

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
SPI, UART/USART, USI
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP, 64-VQFP
For Use With
ATAVRBFLY - KIT EVALUATION AVR BUTTERFLYATSTK502 - MOD EXPANSION AVR STARTER 500
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
ATMEGA16916ASL710
244
ATmega169/V
Table 105. Boundary-scan Signals for the ADC
Note:
If the ADC is not to be used during scan, the recommended input values from Table 105
should be used. The user is recommended not to use the Differential Amplifier during
scan. Switch-Cap based differential amplifier requires fast operation and accurate timing
which is difficult to obtain when used in a scan chain. Details concerning operations of
the differential amplifier is therefore not provided.
The AVR ADC is based on the analog circuitry shown in Figure 115 with a successive
approximation algorithm implemented in the digital logic. When used in Boundary-scan,
the problem is usually to ensure that an applied analog voltage is measured within some
limits. This can easily be done without running a successive approximation algorithm:
apply the lower limit on the digital DAC[9:0] lines, make sure the output from the com-
parator is low, then apply the upper limit on the digital DAC[9:0] lines, and verify the
output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are
shared with a digital port pin as well.
When using the ADC, remember the following
Signal
Name
SCTEST
ST
VCCREN
The port pin for the ADC channel in use must be configured to be an input with pull-
up disabled to avoid signal contention.
In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed
when enabling the ADC. The user is advised to wait at least 200ns after enabling the
ADC before controlling/observing any ADC signal, or perform a dummy conversion
before using the first result.
The DAC values must be stable at the midpoint value 0x200 when having the HOLD
signal low (Sample mode).
1. Incorrect setting of the switches in Figure 115 will make signal contention and may
damage the part. There are several input choices to the S&H circuitry on the negative
input of the output comparator in Figure 115. Make sure only one path is selected
from either one ADC pin, Bandgap reference source, or Ground.
Direction
as Seen
from the
ADC
Input
Input
Input
Description
Switch-cap TEST
enable. Output from
differential amplifier is
sent out to Port Pin
having ADC_4
Output of differential
amplifier will settle
faster if this signal is
high first two ACLK
periods after AMPEN
goes high.
Selects Vcc as the
ACC reference
voltage.
(1)
Recommen-
ded Input
when not
in Use
(Continued)
0
0
0
Output Values when
Recommended Inputs
are Used, and CPU is
not Using the ADC
2514P–AVR–07/06
0
0
0

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