PN5120A0HN1/C1 NXP Semiconductors, PN5120A0HN1/C1 Datasheet - Page 53

• Manufacturer Part Number: PN5120A0HN1/C1
• Description: RF Wireless Misc COMBO ANALOG/DIGI IC
• Manufacturer: NXP Semiconductors
• Type: Transmission Moduler

Specifications of PN5120A0HN1/C1

• Package / Case: HVQFN EP
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 30 C
• Mounting Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: PN5120A0HN1/C1,157

NXP Semiconductors
Table 117. AnalogTestReg register (address 38h); reset value: 00h, 00000000b
Table 118. Description of AnalogTestReg bits
111334
Bit
7 to 4
3 to 0
Product data sheet
Access Rights
Symbol
AnalogSelAux1
AnalogSelAux2
8.2.4.9 AnalogTestReg
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7
Controls the pins AUX1 and AUX2
Description
Controls the AUX pin.
Note: All test signals are described in
Value
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
r/w
Description
Tristate
Output of TestDAC1 (AUX1), output of TESTDAC2 (AUX2)
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal Corr1
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal Corr2
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal MinLevel
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal ADC channel I
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal ADC channel Q
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal ADC channel I combined with Q
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
Testsignal for production test
Note: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended.
SAM clock (13.56 MHz)
HIGH
LOW
TxActive
At 106 kbit: HIGH during Startbit, Data bit, Parity and CRC. At 212 and 424 kbit: High
during Preamble, Sync, Data and CRC.
RxActive
At 106 kbit: High during databit, Parity and CRC.
At 212 and 424 kbit: High during data and CRC.
Subcarrier detected
106 kbit: not applicable
212 and 424 kbit: High during last part of Preamble, Sync data and CRC
TestBus-Bit as defined by the TstBusBitSel in register TestSel1Reg.
AnalogSelAux1
6
Rev. 3.4 — 8 September 2009
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5
r/w
4
Section 19
“Testsignals”.
r/w
3
r/w
AnalogSelAux2
2
Transmission Module
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1
© NXP B.V. 2010. All rights reserved.
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