cs5535 National Semiconductor Corporation, cs5535 Datasheet - Page 179

• Manufacturer Part Number: cs5535
• Description: Geode Cs5535 Companion Multi-function South Bridge
• Manufacturer: National Semiconductor Corporation

Revision 0.8
TAP Controller Functional Description
Instruction
000000h and
FFFFE8h
01FFFAh through
1DFFFAh
01FFFFh through
1DFFFFh
81FFFAh
83FFFAh
85FFFAh
87FFFAh
8BFFFAh
8DFFFAh
8FFFFAh
FFFFDFh
FFFFFDh
FFFFFEh
FFFFFFh
Variable
Length
240
DR
70
66
24
70
21
32
--
1
4
8
1
1
IR Name
EXTEST
TAPSCAN[0:28]
TAPFUNC[0:28]
GL_ADDR
GL_DATA
PADACC
PROGMISR
GL_ADDR_ACT
TST_IDDQ
REVID
TRISTATE
BISTDR
IDCODE
BYPASS
Table 4-38. TAP Controller Instructions
(Continued)
Description
Boundary Scan Ring. IEEE 1149.1 specification compliant.
(Mapped twice in IR address space.)
TAP Scan Chain 0 through Chain 28. These are parts of the
internal scan chain subdivided according to a common CCU
clock.
TAP Function Chain 0 through Chain 28. One capture cycle
applied to the individual CCU scan chain clocked by the func-
tional clock.
GeodeLink Address. Access GeodeLink request packet and
data packet control bits.
GeodeLink Data. Access GeodeLink data.
Pad Access. Padtestmode for access to analog and memory
BIST signals.
Program instruction. This instruction provides direct access to
an MSR used for the ROM memory BIST test. Not supported.
GeodeLink Address Action. Same data register as GL_ADDR,
but no GeodeLink transactions are triggered by the access -
only by GLCP debug action.
Test IDDQ. Put chip in a mode for running IDDQ tests.
Revision ID. The TAP instruction used to access the current
revision code (8 bits) for the chip.
TRI-STATE. Put chip into TRI-STATE and comparison mode.
Parallel RAM BIST. Internal data register (for chip test).
ID Code. 0FE1101Fh for CS5535.
MSB
ID[31:28]
Version
Bypass. IEEE 1149.1 specification requires all 1s to be
bypassed.
179
ID27
Part Number
ID[12:11]
Manuf. ID
www.national.com
LSB
ID[1:0]
1