th58nvg1s3aft05 TOSHIBA Semiconductor CORPORATION, th58nvg1s3aft05 Datasheet - Page 22

• Manufacturer Part Number: th58nvg1s3aft05
• Description: 2gbit 256m U 8bits Cmos Nand E2 Prom
• Manufacturer: TOSHIBA Semiconductor CORPORATION

Status Read
The Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass
/fail) of a Program or Erase operation, and determine whether the device is in Protect mode. The device status
is output via the I/O port on the
Table 5. Status output table
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
I/O8
RY
RY
to I/O8
The device automatically implements the execution and verification of the Program and Erase operations.
The resulting information is outlined in Table 5.
An application example with multiple devices is shown in Figure 6.
System Design Note: If the
diagram, the Status Read function can be used to determine the status of each individual device.
CLE
CLE
ALE
I/O1
ALE
/
/
CE
WE
WE
CE
RE
RE
BY
BY
I/O
N
1
Data Cache Busy
CE
Device
Chip Status 1
Chip Status 2
Ready/Busy
Write Protect
1
Not Used
Not Used
Not Used
STATUS
1
70H
RY
RE
Pass: 0
Pass: 0
0
0
0
Ready: 1
Ready: 1
Protect: 0
CE
/
Figure 6. Status Read timing application example
Status on Device 1
BY
Device
2
clock after a “70H" command input.
2
pin signals from multiple devices are wired together as shown in the
OUTPUT
CE
70H
Device
Fail: 1
Fail: 1
Busy: 0
Busy: 0
Not Protected: 1
3
Busy
3
Status on Device N
only valid when the device is in the Ready
state.
The Pass/Fail status on I/O1 and I/O2 is
TH58NVG1S3AFT05
2003-05-19A
CE
Device
N
N
CE 
N
22/32
Device
N  1
1