mfr4200 Freescale Semiconductor, Inc, mfr4200 Datasheet - Page 222

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mfr4200

Manufacturer Part Number
mfr4200
Description
Flexray Communication Controllers
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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Electrical Characteristics
A.1.6
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
222
Num C
1
2
3
4
5
Human Body
Machine
Latch-up
Model
T Human Body Model (HBM)
T Machine Model (MM)
T Charge Device Model (CDM)
T Latch-up Current at T
T Latch-up Current at T
ESD Protection and Latch-up Immunity
positive
negative
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Minimum input voltage limit
Maximum input voltage limit
Table A-3. ESD and Latch-up Protection Characteristics
Table A-2. ESD and Latch-up Test Conditions
A
A
Rating
= 125qC
= 27qC
Description
MFR4200 Data Sheet, Rev. 0
Symbol
V
V
V
I
I
HBM
CDM
LAT
LAT
MM
Symbol
R1
R1
C
C
-
-
-
-
2000
+100
+200
-100
-200
Min
200
500
Value
1500
100
200
-2.5
7.5
0
Freescale Semiconductor
3
3
3
3
-
-
Max
-
-
-
-
-
Ohm
Ohm
Unit
pF
pF
V
V
Unit
mA
mA
V
V
V

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