AT91SAM7X512-AU Atmel, AT91SAM7X512-AU Datasheet - Page 45

• Manufacturer Part Number: AT91SAM7X512-AU
• Description: MCU ARM 512K HS FLASH 100-LQFP
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7X512-AU

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 62
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LQFP
• Processor Series: AT91SAMx
• Core: ARM7TDMI
• Data Bus Width: 32 bit
• Data Ram Size: 128 KB
• Interface Type: CAN, SPI, SSC, TWI, USART, USB
• Maximum Clock Frequency: 55 MHz
• Number Of Programmable I/os: 13
• Number Of Timers: 3
• Operating Supply Voltage: 3 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, KSK-AT91SAM7X-PL, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP, AT91SAM7X-EK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit
• No. Of I/o's: 62
• Ram Memory Size: 128KB
• Cpu Speed: 55MHz
• No. Of Timers: 3
• No. Of Pwm Channels: 4
• Digital Ic Case Style: LQFP
• Rohs Compliant: Yes
• For Use With: AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7X-EK - KIT EVAL FOR AT91SAM7X256/128
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

12. Debug and Test Features
12.1
12.2
6120H–ATARM–17-Feb-09
Description
Block Diagram
The AT91SAM7X Series features a number of complementary debug and test capabilities. A
common JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
AT91SAM7X512/256/128 Preliminary
ICE/JTAG
TAP
Reset
and
Test
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
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