MC9S08SH16MTG Freescale Semiconductor, MC9S08SH16MTG Datasheet - Page 314

• Manufacturer Part Number: MC9S08SH16MTG
• Description: MCU 8BIT 16K FLASH 16-TSSOP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08SH16MTG

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, LIN, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 13
• Program Memory Size: 16KB (16K x 8)
• Program Memory Type: FLASH
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 16-TSSOP
• Core: S08
• Processor Series: MC9S08Sxx
• Data Bus Width: 8 bit
• Maximum Clock Frequency: 40 MHz
• Data Ram Size: 1 KB
• On-chip Adc: Yes
• Number Of Timers: 3
• Operating Supply Voltage: 2.7 V to 5.5 V
• Operating Temperature Range: - 40 C to + 125 C
• Mounting Style: SMD/SMT
• A/d Bit Size: 10 bit
• A/d Channels Available: 8
• Height: 1.05 mm
• Interface Type: SCI, SPI, I2C
• Length: 5 mm
• Maximum Operating Temperature: + 125 C
• Minimum Operating Temperature: - 40 C
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 2.7 V
• Width: 4.4 mm
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

Appendix A Electrical Characteristics
1
The susceptibility performance classification is described in
314
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-19. Susceptibility Performance Classification
Table A-18. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9S08SH32 Series Data Sheet, Rev. 2
V
Symbol
CS_EFT
PRELIMINARY
package type
Conditions
V
T
A
DD
= +25
TBD
=
Performance Criteria
TBD
o
C
Table
TBD
f
TBD
OSC
crystal
/f
A-19.
bus
BUS
Result
A
B
C
D
Freescale Semiconductor
Amplitude
(Min)
TBD
TBD
TBD
TBD
1
Unit
kV