AT91SAM9261SB-CU-999 Atmel, AT91SAM9261SB-CU-999 Datasheet - Page 55
![no-image](/images/manufacturer_photos/0/0/78/atmel_sml.jpg)
AT91SAM9261SB-CU-999
Manufacturer Part Number
AT91SAM9261SB-CU-999
Description
IC MCU ARM9 ULTRA LP 217LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM9261SB-CU-999.pdf
(709 pages)
Specifications of AT91SAM9261SB-CU-999
Core Processor
ARM9
Core Size
16/32-Bit
Speed
190MHz
Connectivity
EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
DMA, LCD, POR, PWM, WDT
Number Of I /o
96
Program Memory Size
32KB (32K x 8)
Program Memory Type
ROM
Ram Size
48K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
217-LFBGA
Processor Series
AT91SAMx
Core
ARM926EJ-S
Data Bus Width
32 bit
Data Ram Size
16 KB
Interface Type
2-Wire, I2S, SPI, USB
Maximum Clock Frequency
190 MHz
Number Of Programmable I/os
96
Number Of Timers
4
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM9261-EK
Minimum Operating Temperature
- 40 C
For Use With
AT91SAM9261-EK - KIT EVAL FOR AT91SAM926EJ-SAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
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- Download datasheet (10Mb)
12.3.2
12.4
6242E–ATARM–11-Sep09
Debug and Test Pin Description
Test Environment
Figure 12-3 on page 55
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
NTRST
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
AT91SAM9261S-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
Interface
AT91SAM9261S
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Test Reset Signal
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
Chip n
ICE and JTAG
Test Adaptor
Debug Unit
Reset/Test
Chip 2
Chip 1
Input/Output
Tester
AT91SAM9261S
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
Active Level
High
Low
Low
55
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