ADUC7122BBCZ-RL Analog Devices Inc, ADUC7122BBCZ-RL Datasheet - Page 14

PRECISION ANALOG MCU I.C

ADUC7122BBCZ-RL

Manufacturer Part Number
ADUC7122BBCZ-RL
Description
PRECISION ANALOG MCU I.C
Manufacturer
Analog Devices Inc
Series
MicroConverter® ADuC7xxxr
Datasheet

Specifications of ADUC7122BBCZ-RL

Core Processor
ARM7
Core Size
16/32-Bit
Speed
41.78MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
POR, PWM, WDT
Number Of I /o
32
Program Memory Size
126KB (63K x 16)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 13x12b, D/A 12x12b
Oscillator Type
Internal
Operating Temperature
-10°C ~ 95°C
Package / Case
108-LFBGA, CSPBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
ADUC7122BBCZ-RL
ADUC7122BBCZ-RLTR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ADUC7122BBCZ-RL
Manufacturer:
Analog Devices Inc
Quantity:
10 000
ADuC7122
ABSOLUTE MAXIMUM RATINGS
AGND = REFGND = DACGND = GND
unless otherwise noted.
Table 8.
Parameter
AV
AGND to DGND
IOV
Digital Input Voltage to IOGND
Digital Output Voltage to IOGND
V
Analog Inputs to AGND
Analog Outputs to AGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
θ
Peak Solder Reflow Temperature
JA
REF
SnPb Assemblies (10 sec to 30 sec)
RoHS-Compliant Assemblies
108-Ball CSP_BGA
DD
Thermal Impedance
DD
_2.5 and V
(20 sec to 40 sec)
to IOV
to IOGND, AV
DD
REF
_1.2 to AGND
DD
to AGND
REF
Rating
−0.3 V to +0.3 V
−0.3 V to +0.3 V
−0.3 V to +6 V
−0.3 V to +5.3 V
−0.3 V to IOV
−0.3 V to AV
−0.3 V to AV
−0.3 V to AV
−10°C to +95°C
−65°C to +150°C
150°C
40°C/W
240°C
260°C
, T
A
= 25°C,
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. 0 | Page 14 of 96
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Only one absolute maximum rating can be applied at any one time.
ESD CAUTION

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