ST72F321J ST Microelectronics, ST72F321J Datasheet - Page 150

• Manufacturer Part Number: ST72F321J
• Description: 8-BIT MCU
• Manufacturer: ST Microelectronics

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DataSheet
ST72321J
12.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
12.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
12.7.2 Electro Magnetic Interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O ports), the product
is monitored in terms of emission. This emission test is in line with the norm SAE J 1752/3 which specifies
the board and the loading of each pin.
Notes:
1. Data based on characterization results, not tested in production.
150/179
Symbol
Symbol
V
V
S
FESD
FFTB
4
EMI
U
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Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
Peak level
Parameter
Parameter
V
TQFP44package
conforming to SAE J 1752/3
DD
DD
and V
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5V, T
Conditions
DD
A
pins
+25°C,
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
0.1MHz to 30MHz
30MHz to 130MHz
130MHz to 1GHz
SAE EMI Level
Conditions
A
A
Frequency Band
+25°C, f
+25°C, f
Monitored
OSC
OSC
8MHz
8MHz
Max vs. [f
8/4MHz
2.5
18
16
11
Neg
-1.5
-1
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DD
1)
OSC
16/8MHz
and V
Pos
3.0
/f
23
24
17
1.5
1.5
CPU
SS
1)
]
through
dB V
Unit
Unit
kV
-
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