PI7C8150ND Pericom Semiconductor, PI7C8150ND Datasheet - Page 95

• Manufacturer Part Number: PI7C8150ND
• Manufacturer: Pericom Semiconductor

Specifications of PI7C8150ND

• Operating Temperature (min): 0C
• Operating Temperature Classification: Commercial
• Operating Temperature (max): 85C
• Package Type: BGA
• Rad Hardened: No
• Case: BGA
• Dc: 04+
• Lead Free Status / Rohs Status: Not Compliant

16.2
16.3
Table 16-1. TAP Pins
The instruction determines the test to be performed, the test data register to be accessed, or
both. The IR is two bits wide. When the IR is selected, the most significant bit is connected
to TDI, and the least significant bit is connected to TDO. The value presented on the TDI
pin is shifted into the IR on each rising edge of TCK. The TAP controller captures fixed
parallel data (1101 binary). When a new instruction is shifted in through TDI, the value
1101(binary) is always shifted out through TDO, least significant bit first. This helps
identify instructions in a long chain of serial data from several devices.
Upon activation of the TRST_L reset pin, the latched instruction asynchronously changes
to the id code instruction. When the TAP controller moves into the test state other than by
reset activation, the opcode changes as TDI shifts, and becomes active on the falling edge
of TCK.
BOUNDARY SCAN INSTRUCTION SET
The PI7C8150 supports three mandatory boundary-scan instructions (BYPASS, SAMPLE
and EXTEST). The table shown below lists the PI7C8150’s boundary-scan instruction
codes.
TAP TEST DATA REGISTERS
Instruction
Requisite
EXTEST
IEEE 1149.1
Required
SAMPLE
IEEE 1149.1
Required
INTSCAN
CLAMP
BYPASS
/
Opcode (binary)
00000
0001
00010
00100
11111
85
Description
EXTEST initiates testing of external circuitry, typically board-
level interconnects and off chip circuitry. EXTEST connects the
boundary-scan register between TDI and TDO. When EXTEST
is selected, all output signal pin values are driven by values
shifted into the boundary-scan register and may change only of
the falling edge of TCK. Also, when EXTEST is selected, all
system input pin states must be loaded into the boundary-scan
register on the rising-edge of TCK.
SAMPLE performs two functions:
!
!
Enable internal SCAN test
CLAMP instruction allows the state of the signals driven from
component pins to be determined from the boundary-scan
register while the bypass register is selected as the serial path
between TDI and TDO. The signal driven from the component
pins will not change while the CLAMP instruction is selected.
BYPASS instruction selects the one-bit bypass register between
TDI and TDO pins. 0 (binary) is the only instruction that
accesses the bypass register. While this instruction is in effect,
all other test data registers have no effect on system operation.
Test data registers with both test and system functionality
performs their system functions when this instruction is selected.
A snapshot of the sample instruction is captured on the
rising edge of TCK without interfering with normal
operation. The instruction causes boundary-scan register
cells associated with outputs to sample the value being
driven.
On the falling edge of TCK, the data held in the boundary-
scan cells is transferred to the slave register cells.
Typically, the slave latched data is applied to the system
outputs via the EXTEST instruction.
March 19, 2003 – Revision 1.04
2-PORT PCI-TO-PCI BRIDGE
ADVANCE INFORMATION
PI7C8150