SAM9263 Atmel Corporation, SAM9263 Datasheet - Page 253
SAM9263
Manufacturer Part Number
SAM9263
Description
Manufacturer
Atmel Corporation
Datasheets
1.M40800.pdf
(284 pages)
2.M40800.pdf
(153 pages)
3.SAM9260.pdf
(290 pages)
4.SAM9261.pdf
(248 pages)
5.SAM9263.pdf
(1109 pages)
6.SAM9263.pdf
(51 pages)
Specifications of SAM9263
Flash (kbytes)
0 Kbytes
Pin Count
324
Max. Operating Frequency
240 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
160
Ext Interrupts
160
Usb Transceiver
3
Usb Speed
Full Speed
Usb Interface
Host, Device
Spi
2
Twi (i2c)
1
Uart
4
Can
1
Ssc
2
Ethernet
1
Sd / Emmc
2
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
Yes
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
96
Self Program Memory
NO
External Bus Interface
2
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Fpu
No
Mpu / Mmu
No / Yes
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
- M40800 PDF datasheet
- M40800 PDF datasheet #2
- SAM9260 PDF datasheet #3
- SAM9261 PDF datasheet #4
- SAM9263 PDF datasheet #5
- SAM9263 PDF datasheet #6
- Current page: 253 of 290
- Download datasheet (5Mb)
C.5.5
ARM DDI 0165B
Scan chains 1 and 2
The scan chain present between DBGSDIN and DBGSDOUT is connected between
DBGTDI and DBGTDO whenever scan chain 3 is selected, or when any unassigned
scan chain number is selected. If there is more than one external scan chain, a
multiplexor must be built externally to apply the desired scan chain output to
DBGSDOUT. The multiplexor can be controlled by decoding DBGSCREG[4:0].
The scan chains allow serial access to the core logic and to the EmbeddedICE hardware
for programming purposes. Each scan chain cell is simple, and comprises a serial
register and a multiplexor. A typical cell is shown in Figure C-4.
Copyright © 2000 ARM Limited. All rights reserved.
CLK
Serial data in
Table C-2 Scan chain number allocation (continued)
enable
Shift
0
1
Scan chain
number
3
4–15
16–31
Figure C-4 Typical scan chain cell
Serial data out
Test mode
Function
External boundary
scan
Reserved
Unassigned
select
0
1
Debug in depth
C-13
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