ep2sgx30c Altera Corporation, ep2sgx30c Datasheet - Page 234

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ep2sgx30c

Manufacturer Part Number
ep2sgx30c
Description
Stratix Ii Gx Device Data Sheet
Manufacturer
Altera Corporation
Datasheet

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Timing Model
4–64
Stratix II GX Device Handbook, Volume 1
LVTTL
LVCMOS
2.5 V
1.8 V
1.5 V
PCI
PCI-X
SSTL-2 Class I
SSTL-2 Class II
SSTL-18 Class I
SSTL-18 Class II
1.8-V HSTL Class I
Table 4–54. Timing Measurement Methodology for Input Pins (Part 1 of 2)
(6)
(5)
(5)
(5)
(6)
(5)
(5)
I/O Standard
Figure 4–10. Measurement Setup for t
Table 4–54
Din
Din
OE
OE
specifies the input timing measurement setup.
V
CCIO
3.135
3.135
2.375
1.710
1.425
2.970
2.970
2.325
2.325
1.660
1.660
1.660
(V)
Measurement Conditions
t
t
1 MΩ
1 MΩ
ZX
ZX
V
, Tristate to Driving High
Dout
, Tristate to Driving Low
Dout
1.163
1.163
0.830
0.830
0.830
REF
(V)
Dout
Dout
zx
Din
Din
OE
OE
Edge Rate (ns)
Disable
Disable
3.135
3.135
2.375
1.710
1.425
2.970
2.970
2.325
2.325
1.660
1.660
1.660
Notes
Enable
Enable
½ V
½ V
(1), (2), (3),
CCINT
CCINT
Measurement Point
t
t
zh
zl
Altera Corporation
VMEAS (V)
October 2007
1.5675
1.5675
1.1875
0.7125
1.1625
1.1625
0.855
1.485
1.485
0.83
0.83
0.83
(4)
½ V
½ V
“1”
“0”
CCIO
CCIO

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