ep2sgx30c Altera Corporation, ep2sgx30c Datasheet - Page 288
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ep2sgx30c
Manufacturer Part Number
ep2sgx30c
Description
Stratix Ii Gx Device Data Sheet
Manufacturer
Altera Corporation
Datasheet
1.EP2SGX30C.pdf
(314 pages)
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Duty Cycle Distortion
Duty Cycle
Distortion
4–118
Stratix II GX Device Handbook, Volume 1
Duty cycle distortion (DCD) describes how much the falling edge of a
clock is off from its ideal position. The ideal position is when both the
clock high time (CLKH) and the clock low time (CLKL) equal half of the
clock period (T), as shown in
non-ideal falling edge from the ideal falling edge, such as D1 for the
falling edge A and D2 for the falling edge B (see
maximum DCD for a clock is the larger value of D1 and D2.
Figure 4–11. Duty Cycle Distortion
DCD expressed in absolution derivation, for example, D1 or D2 in
Figure
percentage, and the percentage number is clock-period dependent. DCD
as a percentage is defined as:
DCD Measurement Techniques
DCD is measured at an FPGA output pin driven by registers inside the
corresponding I/O element (IOE) block. When the output is a single data
rate signal (non-DDIO), only one edge of the register input clock (positive
or negative) triggers output transitions
DCD present on the input clock signal or caused by the clock input buffer
or different input I/O standard does not transfer to the output signal.
(T/2 – D1) / T (the low percentage boundary)
(T/2 + D2) / T (the high percentage boundary)
4–11, is clock-period independent. DCD can also be expressed as a
CLKH = T/2
Falling Edge A
Figure
Ideal Falling Edge
Clock Period (T)
D1
4–11. DCD is the deviation of the
D2
Falling Edge B
(Figure
CLKL = T/2
4–12). Therefore, any
Figure
Altera Corporation
4–11). The
October 2007
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