cn8237 Mindspeed Technologies, cn8237 Datasheet - Page 383
cn8237
Manufacturer Part Number
cn8237
Description
Atm Oc-12 Servicesar Plus With Xbr Traffic Management
Manufacturer
Mindspeed Technologies
Datasheet
1.CN8237.pdf
(415 pages)
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Table A-1. Boundary Scan Signals
28237-DSH-001-C
TRST*
TCLK
TMS
TDO
TDI
Name
Pin
Test Logic Reset
Test Clock
Test Mode Select
Serial Test Data Output
Serial Test Data Input
Signal Name
Appendix A : Boundary Scan
The CN8237 supports boundary scan testing conforming to IEEE Standard
1149.1-1990 and Supplement B, 1994. This appendix is intended to assist the
customer in developing boundary scan tests for printed circuit boards and systems
that use the CN8237. It is assumed that the reader is familiar with boundary scan
terminology.
signals of the device for board and system-level testing. This circuitry also
conforms to IEEE Std 1149.1-1990. The boundary scan test logic is accessed
through five dedicated pins on the CN8237 (see
an Instruction register (IR), and the Tap Access Port (TAP) controller (see
Figure
The Boundary Scan section of the CN8237 provides access to all external I/O
The test circuitry includes the Boundary Scan register, a BYPASS register,
A-1).
Mindspeed Technologies
I/O
O
I
I
I
I
When at a logic low, this signal asynchronously resets the boundary scan
test circuitry and puts the test controller into the reset state. This state
allows normal system operation.
Test clocking is generated externally by the system board or by the tester.
TCLK can be stopped in either the high state or the low state.
Decoded to control test operations.
Outputs serial test pattern data.
Input for serial test pattern data.
A
™
Definition
Table
A-1).
A-1
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