ST10F272M-4Q3 STMICROELECTRONICS [STMicroelectronics], ST10F272M-4Q3 Datasheet - Page 131

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ST10F272M-4Q3

Manufacturer Part Number
ST10F272M-4Q3
Description
16-bit MCU with 256 Kbyte Flash memory and 20 Kbyte RAM
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
ST10F272M
Table 58.
1. Two 64 Kbyte Flash Sectors may be typically used to emulate up to 4, 8 or 16 Kbytes of EEPROM. Therefore, in case of an
24.7
Table 59.
Analog Reference voltage
Analog Ground voltage
Analog Input voltage
Reference supply current
Sample time
Conversion time
Differential Non Linearity
Integral Non Linearity
Offset Error
Total unadjusted error
Coupling Factor between inputs
Input Pin Capacitance
Sampling Capacitance
Number of program / erase cycles
emulation of a 16 Kbyte EEPROM, 100,000 Flash Program / Erase cycles are equivalent to 800,000 EEPROM
Program/Erase cycles. For an efficient use of the EEPROM Emulation please refer to dedicated Application Note document
(AN2061 - “EEPROM Emulation with
representative to obtain a copy of such a guideline document.
(-40°C < T
(6)
Flash data retention characteristics
A/D converter characteristics
V
V
A/D converter characteristics
Parameter
100000
0 - 100
DD
SS
10000
1000
A
≤ V
= 5V ± 10%, V
< 125°C)
(2)
(6)
(6)
AGND
(3)(8)
(3)(8)
(6)
(1)
≤ V
(3)(7)
SS
SS
ST10F2xx”). Contact your local field service, local sales person or STMicroelectronics
+ 0.2V
= 0V, T
V
V
V
I
t
t
DNL
INL
OFS
TUE
K
C
C
C
AREF
S
C
AREF
AGND
AIN
P1
P2
S
Symbol
256 Kbyte (code store)
A
= -40 to +125°C, 4.5V ≤ V
SR
SR
SR
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
> 20 years
V
-
-
-
(average ambient temperature 60°C)
Min
V
-1.5
-1.5
-2.0
-5.0
-7.0
4.5
AGND
-1
1
3
SS
Limit values
Data retention time
V
SS
V
Max
+1.5
+1.5
+2.0
+5.0
+7.0
10
V
3.5
AREF
+1
5
1
3
4
6
DD
+ 0.2
–6
AREF
64 Kbyte (EEPROM emulation)
Unit
LSB
LSB
LSB
LSB
mA
µA
µs
µs
pF
pF
pF
≤ V
V
V
V
Electrical characteristics
DD
Running mode
Power-down mode
(4)
(5)
No overload
No overload
No overload
Port5
Port1 - No overload
Port1 - Overload
On both Port5 and Port1
Port5
Port1
,
> 20 years
> 20 years
10 years
1 year
Test condition
(3)
(3)
131/176
(3)
(1)

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