M1AFS250-FGG256I Actel Corporation, M1AFS250-FGG256I Datasheet - Page 192

• Manufacturer Part Number: M1AFS250-FGG256I
• Description: Actel Fusion Family Of Mixed Signal Fpgas
• Manufacturer: Actel Corporation

Device Architecture
Table 2-96 • Short Current Event Duration before Failure
Table 2-97 • Schmitt Trigger Input Hysteresis
Table 2-98 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
2- 17 6
Input Buffer
LVTTL/LVCMOS (Schmitt trigger
disabled)
LVTTL/LVCMOS (Schmitt trigger
enabled)
HSTL/SSTL/GTL
LVDS/BLVDS/M-LVDS/LVPECL
Note:
Temperature
–40°C
25°C
70°C
85°C
100°C
Input Buffer Configuration
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
2.5 V LVCMOS (Schmitt trigger mode)
1.8 V LVCMOS (Schmitt trigger mode)
1.5 V LVCMOS (Schmitt trigger mode)
0°C
*The maximum input rise/fall time is related only to the noise induced into the input buffer trace. If the noise is
low, the rise time and fall time of input buffers, when Schmitt trigger is disabled, can be increased beyond the
maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board noise. Actel
recommends signal integrity evaluation/characterization of the system to ensure there is no excessive noise
coupling into input signals.
Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers
Input Rise/Fall Time (min.)
No requirement
No requirement
No requirement
No requirement
R e visio n 1
noise voltage cannot exceed
Schmitt hysteresis
No requirement, but input
Time before Failure
Input Rise/Fall Time (max.)
>20 years
>20 years
>20 years
6 months
5 years
2 years
Hysteresis Value (typ.)
10 ns*
10 ns*
10 ns*
240 mV
140 mV
80 mV
60 mV
20 years (100°C)
20 years (100°C)
10 years (100°C)
10 years (100°C)
Reliability