MBM29QM12DH Fujitsu Microelectronics, Inc., MBM29QM12DH Datasheet - Page 3

• Manufacturer Part Number: MBM29QM12DH
• Description: Page Mode Flash Memory 128m 8m X 16 Bit
• Manufacturer: Fujitsu Microelectronics, Inc.

MBM29QM12DH
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(Continued)
The device provides truly high performance non-volatile Flash memory solution. The device offers fast page
access times of 20 ns with random access times of 60 ns, allowing operation of high-speed microprocessors
without wait states. To eliminate bus contention the device has separate chip enable (CE), write enable (WE),
and output enable (OE) controls. The page size is 8 words.
The dual operation function provides simultaneous operation by dividing the memory space into four banks. The
device can improve overall system performance by allowing a host system to program or erase in one bank,
then immediately and simultaneously read from the other bank with zero latency. This releases the system from
waiting for the completion of program or erase operations.
The device is command set compatible with JEDEC standard E
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PROMs. Commands are written to the command
register using standard microprocessor write timings. Register contents serve as input to an internal state-
machine which controls the erase and programming circuitry. Write cycles also internally latch addresses and
data needed for the programming and erase operations. Reading data out of the device is similar to reading
from 5.0 V and 12.0 V Flash or EPROM devices.
The device is programmed by executing the program command sequence. This will invoke the Embedded
Program Algorithm which is an internal algorithm that automatically times the program pulse widths and verifies
proper cell margins. Typically, each 32K words sector can be programmed and verified in about 0.3 seconds.
Erase is accomplished by executing the erase command sequence. This will invoke the Embedded Erase
Algorithm which is an internal algorithm that automatically preprograms the array if it is not already programmed
before executing the erase operation. During erase, the device automatically times the erase pulse widths and
verifies proper cell margins.
Any individual sector is typically erased and verified in 0.5 second. (If already preprogrammed.)
The device also features a sector erase architecture. The sector mode allows each sector to be erased and
reprogrammed without affecting other sectors. The device is erased when shipped from the factory.
The device features single 3.0 V power supply operation for both read and write functions. Internally generated
and regulated voltages are provided for the program and erase operations. A low V
detector automatically
CC
inhibits write operations on the loss of power. The end of program or erase is detected by Data Polling of DQ
,
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by the Toggle Bit feature on DQ
, output pin. Once the end of a program or erase cycle has been completed,
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the device internally resets to the read mode.
Fujitsu’s Flash technology combines years of Flash memory manufacturing experience to produce the highest
levels of quality, reliability, and cost effectiveness. The device memory electrically erases all bits within a sector
simultaneously via Fowler-Nordhiem tunneling. The words are programmed one word at a time using the EPROM
programming mechanism of hot electron injection.
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