atmega323l ATMEL Corporation, atmega323l Datasheet - Page 168
![no-image](/images/manufacturer_photos/0/0/79/atmel_corporation_sml.jpg)
atmega323l
Manufacturer Part Number
atmega323l
Description
Atmega323 8-bit Avr Microcontroller With 32k Bytes Of In-system Programmable Flash
Manufacturer
ATMEL Corporation
Datasheet
1.ATMEGA323L.pdf
(247 pages)
- Current page: 168 of 247
- Download datasheet (4Mb)
Boundary-Scan Chain
Scanning the Digital Port Pins
168
ATmega323(L)
The Boundary-Scan chain has the capability of driving and observing the logic levels on
the digital I/O pins.
Note:
Figure 89 shows the Boundary-Scan Cell for Bidirectional Port Pins with Pull-up func-
tion. The cell consists of a standard Boundary-Scan cell for the Pull-up function, and a
Bidirectional pin cell that combines the three signals Output Control – OC, Output Data
– OD, and Input Data – ID, into only a two-stage Shift Register.
Figure 89. Boundary-Scan Cell For bidirectional Port Pin with Pull-up Function.
The Boundary-Scan logic is not included in the figures in the datasheet. Figure 90
shows a simple digital Port Pin as described in the section “I/O Ports” on page 137. The
Boundary-Scan details from Figure 89 replaces the dashed box in Figure 90.
Pullup Disable (PLD)
Output Control (OC)
Output Data (OD)
Input Data (ID)
Compatibility issues regarding future devices: Future devices, included replacements for
ATmega323 will have Pull-Up Enable signals instead of the Pull-Up Disable signals in the
scan path (i.e. inverted logic). The scan cell for the reset signal will have the same logic
level as the external pin (i.e. inverted logic). The length of the scan-chain is likely to
change in future devices.
0
1
From Last Cell
0
1
0
1
0
1
ShiftDR
ClockDR
D
D
D
FF2
FF1
FF0
To Next Cell
Q
Q
Q
UpdateDR
D
G
D
G
D
G
LD2
LD1
LD0
Q
Q
Q
0
1
0
1
0
1
EXTEST
1457G–AVR–09/03
Vcc
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