OR3T125-5BA352 AGERE [Agere Systems], OR3T125-5BA352 Datasheet - Page 59

• Manufacturer Part Number: OR3T125-5BA352
• Description: 3C and 3T Field-Programmable Gate Arrays
• Manufacturer: AGERE [Agere Systems]

Data Sheet
June 1999
Special Function Blocks
The external test (EXTEST) instruction allows the inter-
connections between ICs in a system to be tested for
opens and stuck-at faults. If an EXTEST instruction is
performed for the system shown in Figure 36, the con-
nections between U1 and U2 (shown by nets a, b, and
c) can be tested by driving a value onto the given nets
from one device and then determining whether the
same value is seen at the other device. This is deter-
mined by shifting 2 bits of data for each pin (one for the
output value and one for the 3-state value) through the
BSR until each one aligns to the appropriate pin. Then,
based upon the value of the 3-state signal, either the
I/O pad is driven to the value given in the BSR, or the
BSR is updated with the input value from the I/O pad,
which allows it to be shifted out TDO.
The SAMPLE/PRELOAD instruction is useful for sys-
tem debugging and fault diagnosis by allowing the data
at the FPGA’s I/Os to be observed during normal
Table 14. Boundary-Scan ID Code
* PLC array size of FPGA, reverse bit order.
Note: Table assumes version 0.
Lucent Technologies Inc.
OR3C/T55
OR3C/T80
OR3T125
OR3T165
OR3T20
OR3T30
Device
Version
(4 bits)
0000
0000
0000
0000
0000
0000
0100100000 110000
0000010000 110000
0011000000 110000
0111000000 110000
0110100000 110000
0011100000 110000
(10 bits)
Part*
(continued)
(6 bits)
Family
Manufacturer
00000011101
00000011101
00000011101
00000011101
00000011101
00000011101
(11 bits)
operation or written during test operation. The data for
all of the I/Os is captured simultaneously into the BSR,
allowing them to be shifted-out TDO to the test host.
Since each I/O buffer in the PICs is bidirectional, two
pieces of data are captured for each I/O pad: the value
at the I/O pad and the value of the 3-state control sig-
nal. For preload operation, data is written from the BSR
to all of the I/Os simultaneously.
There are five ORCA -defined instructions. The PLC
scan rings 1 and 2 (PSR1, PSR2) allow user-defined
internal scan paths using the PLC latches/FFs. The
RAM_Write Enable (RAM_W) instruction allows the
user to serially configure the FPGA through TDI. The
RAM_Read Enable (RAM_R) allows the user to read
back RAM contents on TDO after configuration. The
IDCODE instruction allows the user to capture a 32-bit
identification code that is unique to each device and
serially output it at TDO. The IDCODE format is shown
in Table 14.
ORCA Series 3C and 3T FPGAs
(1 bit)
LSB
1
1
1
1
1
1
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