peb2035 ETC-unknow, peb2035 Datasheet - Page 65

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peb2035

Manufacturer Part Number
peb2035
Description
Communications Advanced Cmos Frame Aligner
Manufacturer
ETC-unknow
Datasheet

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Interface to Microprocessor
Test Functions
There are three types of monitoring/testing functions:
Alarm Simulation
Alarm simulation does not affect the normal operation of the device, i.e. all channels remain
available for transmission. However, possible ‘real’ alarm conditions are not reported to the
processor or to the remote end when the device is in the alarm simulation mode.
The alarm simulation is initiated by setting the bit CCR.SIM. The following alarms are simulated:
Semiconductor Group
Passive tests which do not affect the normal operation of the device (e.g.: parity check)
Active tests which partly degrade the functionality (e.g.: test loop for a single channel)
Diagnostics, during which the device is not operational (e.g.: diagnostic loop of an entire trunk).
No signal
Alarm Indication Signal (AIS)
Loss of pulse frame
Remote alarm indication
Receive slip indication
Transmit slip indication
Receive parity error
Transmit parity error
D0-7
A0-3
WRQ
RDQ
CEQ
COS
AINT
RREQ
XREQ
RMFB
XMFB
AFT
I/O
I
I
I
I
I
O
O
O
O
O
I
Bidirectional data bus
Address bus
Write enable
Read enable
Chip enable
Carrier Out of Service
Initiates transmission of AIS via XDOP, XDOM, and XOID.
Alarm Interrupt
If enabled via bit CCR.AINT, this signal may be triggered by any one of
the 11 (PCM 30) or 9 (PCM 24) alarm sources configured via register
MASK, via bit XC1.MCA, and via bits XSP.MRMB and XSP.MXMB (PCM
30 mode only). Acknowledging is done by writing a ‘1’ to bit LOOP.AIA.
as above
as above
PCM 24: as above
PCM 24: as above
PCM 24: Additional Function Transmit
If bit ACR.EXMF is set, this input signal can be used to synchronize the
transmitter of the ACFA externally for multiframe begin.
65
PEB 2035

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