n25q032 Numonyx, n25q032 Datasheet - Page 157

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n25q032

Manufacturer Part Number
n25q032
Description
32-mbit 3 V, Multiple I/o, 4-kbyte Subsector Erase, Xip Enabled, Serial Flash Memory With 108 Mhz Spi Bus Interface
Manufacturer
Numonyx
Datasheet

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16
Note:
Table 39.
1. Additional secure options are available upon request. For security features options please refer to AN:309025
Example:
Device type
N25Q = serial Flash memory, Quad I/O, XiP
Device density
032 = 032 Mbit
Technology
A = 65 nm
Feature set
1 = Byte addressability, Hold pin, Numonyx XiP
2 = Byte addressability, Hold pin, Basic XiP
3 = Byte addressability, Reset pin, Numonyx XiP
4 = Byte addressability, Reset pin, Basic XiP
Operating voltage
3 = VCC = 2.7 V to 3.6 V
Block Structure
E = Uniform (no boot sectors)
Package
F8 = VDFPN8 8 x 6 mm (MLP8) (RoHS compliant)
SF = SO16 (300 mils width) (RoHS compliant)
12 = TBGA24 6 x 8 mm (RoHS compliant)
F4 = UFDFPN8 4 x 3 mm (MLP 4 x 3) (RoHS compliant)
F6 = VDFPN8 6 x 5 mm (MLP 6 x 5) (RoHS compliant)
SE = SO8W (SO8 208 mils body width) (RoHS compliant)
SC = SO8N (SO8 150 mils body width) (RoHS compliant)
Temperature and test flow
4 = Industrial temperature range, –40 to 85 °C: Device tested with standard test flow
A = Automotive temperature range, –40 to 125 °C; Device tested with high reliability
H = Industrial temperature range, –40 to 85 °C; Device tested with high reliability
Security features
0 = No extra security
Packing options
E = Tray packing
F = Tape and reel packing
G = Tube packing
certified test flow
certified test flow
Ordering information
For further information on line items not listed here or on any aspect of this device, please
contact your nearest Numonyx Sales Office.
Ordering information scheme
(1)
N25Q032
A 1 3
E
F8 4
0
E
157/160

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