HYB18T512160A Infineon Technologies AG, HYB18T512160A Datasheet - Page 84

• Manufacturer Part Number: HYB18T512160A
• Description: 512-Mbit Double-Data-Rate-Two SDRAM
• Manufacturer: Infineon Technologies AG

8.3
8.3.1
Address and control input setup time (
from the input signal crossing at the
rising signal and
device under test. Address and control input hold time
.
Figure 68
8.3.2
1. Data input setup time with differential data strobe
Data Sheet
enabled MR[bit10]=0, is referenced from the input
signal crossing at the
data strobe crosspoint for a rising signal, and from
the input signal crossing at the
differential data strobe crosspoint for a falling signal
applied to the device under test. Input waveform
timing with single-ended data strobe enabled
MR[bit10]=1, is referenced from the input signal
crossing at the
crossing
signal crossing at the
ended data strobe crossing
applied to the device under test.
V
Input and Data Setup and Hold Time
Timing Definition for Input Setup (
Input, setup and Hold Time Diagram
Timing Definition for Data Setup (
REF
V
for a rising signal, and from the input
IL(ac)
V
for a falling signal applied to the
IH(ac)
V
IH(ac)
V
level to the data strobe
CK
CK
IL(ac)
V
level to the differential
REF
Reference Loads, Setup & Hold Timing Definition and Slew Rate Derating
level to the single-
V
V
for a falling signal
t
IH(ac)
IL(ac)
IS
) is referenced
level for a
t
level to the
IS
t
IH
84
t
DS
t
IS
t
(
V
signal applied to the device under test.
2. Data input hold time with differential data strobe
IS
t
) and Hold Time (
IH
IL(dc)
) and Hold Time (
512-Mbit Double-Data-Rate-Two SDRAM
) is referenced from the input signal crossing at the
enabled MR[bit10]=0, is referenced from the input
signal crossing at the
data strobe crosspoint for a rising signal and
to the differential data strobe crosspoint for a falling
signal applied to the device under test. Input
waveform timing with single-ended data strobe
enabled MR[bit10]=1, is referenced from the input
signal crossing at the
ended data strobe crossing
and
V
test.
t
IH
REF
HYB18T512[400/800/160]A[C/F]–[3.7/5]
level for a rising signal and
V
for a falling signal applied to the device under
IH(dc)
to the single-ended data strobe crossing
V
V
V
V
V
V
V
DDQ
IH(ac)
IH(dc)
REF
IL(dc)
IL(ac)
SS
t
t
IH
DH
max
max
min
min
V
)
)
IL(dc)
V
IL(dc)
09112003-SDM9-IQ3P
V
level to the differential
REF
V
level to the single-
IH(dc)
Rev. 1.13, 2004-05
for a rising signal
for a falling
V
IH(dc)