AT91SAM9261-CJ-999 Atmel, AT91SAM9261-CJ-999 Datasheet - Page 59
AT91SAM9261-CJ-999
Manufacturer Part Number
AT91SAM9261-CJ-999
Description
IC MCU ARM9 ULTRA LP 217LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM9261-CJ-999.pdf
(749 pages)
Specifications of AT91SAM9261-CJ-999
Core Processor
ARM9
Core Size
16/32-Bit
Speed
190MHz
Connectivity
EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
DMA, LCD, POR, PWM, WDT
Number Of I /o
96
Program Memory Size
32KB (32K x 8)
Program Memory Type
ROM
Ram Size
192K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
217-LFBGA
For Use With
AT91SAM9261-EK - KIT EVAL FOR AT91SAM926EJ-SAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
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12.3.2
12.4
6062M–ATARM–23-Mar-09
Debug and Test Pin Description
Test Environment
Figure 12-3 on page 59
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
NTRST
RTCK
JTAGSEL
TSYNC
TCLK
TPS0 - TPS2
TPK0 - TPK15
Debug and Test Pin List
AT91SAM9261-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
AT91SAM9261
Interface
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Test Reset Signal
Returned Test Clock
JTAG Selection
Trace Synchronization Signal
Trace Clock
Trace ARM Pipeline Status
Trace Packet Port
Chip n
ICE and JTAG
Test Adaptor
Reset/Test
AT91SAM9261 Preliminary
ETM
Chip 2
Chip 1
Tester
Input/Output
Output
Output
Output
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
Low
59
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