AGLE600V2-FGG484 Actel, AGLE600V2-FGG484 Datasheet - Page 44

• Manufacturer Part Number: AGLE600V2-FGG484
• Description: FPGA - Field Programmable Gate Array 600K System Gates
• Manufacturer: Actel

Specifications of AGLE600V2-FGG484

• Processor Series: AGLE600
• Core: IP Core
• Maximum Operating Frequency: 526.32 MHz, 892.86 MHz
• Number Of Programmable I/os: 270
• Data Ram Size: 110592
• Supply Voltage (max): 1.575 V
• Maximum Operating Temperature: + 70 C
• Minimum Operating Temperature: 0 C
• Development Tools By Supplier: AGL-Icicle-Kit, AGL-Dev-Kit-SCS, Silicon-Explorer II, Silicon-Sculptor 3, SI-EX-TCA, FlashPro 4, FlashPro 3, FlashPro Lite
• Mounting Style: SMD/SMT
• Supply Voltage (min): 1.14 V
• Number Of Gates: 600 K
• Package / Case: FPBGA-484
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

IGLOOe DC and Switching Characteristics
Table 2-30 • Duration of Short Circuit Event before Failure
Table 2-31 • Schmitt Trigger Input Hysteresis
Table 2-32 • I/O Input Rise Time, Fall Time, and Related I/O Reliability*
2- 30
Input Buffer
LVTTL/LVCMOS (Schmitt trigger
disabled)
LVTTL/LVCMOS (Schmitt trigger
enabled)
HSTL/SSTL/GTL
LVDS/B-LVDS/M-LVDS/LVPECL
*
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
Input Buffer Configuration
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
2.5 V LVCMOS (Schmitt trigger mode)
1.8 V LVCMOS (Schmitt trigger mode)
1.5 V LVCMOS (Schmitt trigger mode)
1.2 V LVCMOS (Schmitt trigger mode)
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is low, then the
rise time and fall time of input buffers can be increased beyond the maximum value. The longer the rise/fall times, the
more susceptible the input signal is to the board noise. Actel recommends signal integrity evaluation/characterization
of the system to ensure that there is no excessive noise coupling into input signals.
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 36 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 110°C, the short current condition would have to be sustained for more than three
months to cause a reliability concern. The I/O design does not contain any short circuit protection, but
such protection would only be needed in extremely prolonged stress conditions.
Hysteresis Voltage Value (Typ.) for Schmitt Mode Input Buffers
Input Rise/Fall Time
No requirement
No requirement
No requirement
No requirement
(min.)
OSH
R e visio n 8
/I
OSL
No requirement, but input noise
voltage
hysteresis.
events depends on the junction temperature. The
Input Rise/Fall Time (max.)
cannot
Time before Failure
10 ns*
10 ns*
10 ns*
exceed
> 20 years
> 20 years
> 20 years
6 months
Hysteresis Value (typ.)
5 years
2 years
140 mV
240 mV
Schmitt
80 mV
60 mV
40 mV
Reliability
20 years
20 years
10 years
10 years
(100°C)
(100°C)
(100°C)
(100°C)