ST72F324BJ STMICROELECTRONICS [STMicroelectronics], ST72F324BJ Datasheet - Page 152

• Manufacturer Part Number: ST72F324BJ
• Description: 8-bit MCU, 3.8 to 5.5 V operating range with 8 to 32 Kbyte Flash/ROM, 10-bit ADC, 4 timers, SPI, SCI
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Electrical characteristics
12.8.3
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Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: Human Body Model and Machine Model. This test conforms to the
JESD22-A114A/A115A standard.
Table 103. Absolute maximum ratings
1. Data based on characterization results, not tested in production.
Static and dynamic Latch-Up
●
●
Table 104. Electrical sensitivities
Symbol
V
V
V
Symbol
DLU
ESD(HBM)
ESD(CDM)
ESD(MM)
LU
LU: 3 complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
DLU: Electrostatic discharges (one positive then one negative test) are applied to each
pin of three samples when the micro is running to assess the latch-up performance in
dynamic mode. Power supplies are set to the typical values, the oscillator is connected
as near as possible to the pins of the micro and the component is put in reset mode.
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
refer to the application note AN1181.
Static latch-up class
Dynamic latch-up class
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(machine model)
Electrostatic discharge voltage
(charged device model)
Parameter
Ratings
T
T
T
V
f
T
OSC
A
A
A
A
DD
= +25°C
= +85°C
= +125°C
= +25°C
= 5.5V
= 4 MHz
Conditions
T
A
= +25°C
Conditions
specification
EIA/JESD 78
IEC1000-4-2
SAEJ1752/3
Test
and
Maximum value
2000
200
750
Test result
Passed
Passed
ST72324B
(1)
Unit
V