ATSAM3X4EA-AU Atmel, ATSAM3X4EA-AU Datasheet - Page 219

• Manufacturer Part Number: ATSAM3X4EA-AU
• Description: ARM Microcontrollers - MCU QFP144,GREEN, IND TEMP, MRL A
• Manufacturer: Atmel

Specifications of ATSAM3X4EA-AU

• Rohs: yes
• Core: ARM Cortex M3
• Processor Series: SAM3X
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 84 MHz
• Program Memory Size: 256 KB
• Data Ram Size: 64 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 2.4 V to 3.6 V
• Operating Temperature Range: - 40 C to +85 C
• Package / Case: LQFP-144
• Mounting Style: SMD/SMT
• Factory Pack Quantity: 60

13. Debug and Test Features
13.1
13.2
11057B–ATARM–28-May-12
11057B–ATARM–28-May-12
Description
Embedded Characteristics
The SAM3 Series Microcontrollers feature a number of complementary debug and test
capabilities. The Serial Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port
(SW-DP) and JTAG Debug (JTAG-DP) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. It also embeds a serial wire trace.
Figure 13-1. Debug and Test Block Diagram
• Debug access to all memory and registers in the system, including Cortex-M3 register bank
• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and
• Instrumentation Trace Macrocell (ITM) for support of printf style debugging
• IEEE1149.1 JTAG Boundary-can on All Digital Pins
when the core is running, halted, or held in reset.
system profiling
Boundary
TAP
SWJ-DP
Reset
Test
and
POR
JTAGSEL
TDO/TRACESWO
TMS
TCK/SWCLK
TDI
TST
SAM3X/A
SAM3X/A
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