ADC1112D125F2/DB,598 NXP Semiconductors, ADC1112D125F2/DB,598 Datasheet - Page 34

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ADC1112D125F2/DB,598

Manufacturer Part Number
ADC1112D125F2/DB,598
Description
BOARD EVALUATION FOR ADC1112D125
Manufacturer
NXP Semiconductors
Series
-r

Specifications of ADC1112D125F2/DB,598

Design Resources
ADC1x12D Demo Brd PCB Files
Number Of Adc's
2
Number Of Bits
11
Sampling Rate (per Second)
125M
Data Interface
Serial, LVDS/DDR
Input Range
1 ~ 2 Vpp
Power (typ) @ Conditions
1.23W @ 125MSPS
Operating Temperature
-40°C ~ 85°C
Utilized Ic / Part
ADC1112D125
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
568-6891
NXP Semiconductors
Table 28.
Default values are highlighted.
Table 29.
Default values are highlighted.
Table 30.
Default values are highlighted.
Table 31.
Default values are highlighted.
ADC1112D125
Product data sheet
Bit
7 to 0
Bit
7 to 5
4 to 0
Bit
7 to 4
3
2 to 0
Bit
7 to 4
3 to 2
1 to 0
Symbol
TESTPAT_USER[10:3]
Symbol
TESTPAT_USER[2:0]
-
Symbol
-
FASTOTR
FASTOTR_DET[2:0]
Symbol
-
DAV_DRV[1:]
DATA_DRV[1:0]
Test pattern 2 register (address 0015h) bit description
Test pattern 3 register (address 0016h) bit description
Fast OTR register (address 0017h) bit description
CMOS output register (address 0020h) bit description
All information provided in this document is subject to legal disclaimers.
Access
R/W
Access
R/W
-
Access
-
R/W
R/W
Access
-
R/W
R/W
Rev. 2 — 3 March 2011
Value
0000
0000
Value
000
00000
Value
0000
0
1
000
001
010
011
100
101
110
111
Value
00
00
01
10
11
00
01
10
11
Dual 11-bit ADC: CMOS or LVDS DDR digital outputs
Description
custom digital test pattern (bits 10 to 3)
Description
custom digital test pattern (bits 2 to 0)
not used
Description
not used
set fast OTR detect level
Description
not used
drive strength for DAV CMOS output buffer
drive strength for DATA CMOS output buffer
fast OuT-of-Range (OTR) detection
disabled
enabled
−20.56 dB
−16.12 dB
−11.02 dB
−7.82 dB
−5.49 dB
−3.66 dB
−2.14 dB
−0.86 dB
low
medium
high
very high
low
medium
high
very high
ADC1112D125
© NXP B.V. 2011. All rights reserved.
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