MFRC52301HN1,151 NXP Semiconductors, MFRC52301HN1,151 Datasheet - Page 65

IC MIFARE READER 32-HVQFN

MFRC52301HN1,151

Manufacturer Part Number
MFRC52301HN1,151
Description
IC MIFARE READER 32-HVQFN
Manufacturer
NXP Semiconductors
Series
MIFARE®r
Datasheets

Specifications of MFRC52301HN1,151

Frequency
13.56MHz
Package / Case
32-VQFN Exposed Pad, 32-HVQFN, 32-SQFN, 32-DHVQFN
Operating Current
7 mA
Operating Voltage
2.5 V to 3.6 V
Product
RFID Readers
Wireless Frequency
13.56 MHz
Interface Type
RS-232, I2C
Data Rate
100 Kbps
Operating Temperature Range
- 25 C to +85 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Rf Type
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
568-4766
935282956151
MFRC52301HN1
NXP Semiconductors
MFRC523_32
Product data sheet
PUBLIC
9.2.4.8 VersionReg register
9.2.4.9 AnalogTestReg register
Table 130. AutoTestReg register bit descriptions
Shows the MFRC523 software version.
Table 131. VersionReg register (address 37h); reset value: xxh bit allocation
Table 132. VersionReg register bit descriptions
Determines the analog output test signal at, and status of, pins AUX1 and AUX2.
Table 133. AnalogTestReg register (address 38h); reset value: 00h bit allocation
Bit
7
6
5 to 4
3 to 0
Bit
Symbol
Access
Bit
7 to 0
Bit
Symbol
Access
Symbol
reserved
AmpRcv
RFT
SelfTest
[3:0]
Symbol
Version[7:0]
7
7
Value Description
-
1
-
-
AnalogSelAux1[3:0]
Rev. 3.2 — 12 January 2010
6
6
Description
indicates current software version of the MFRC523
Remark: the current version of the MFRC523 is 90h or 91h
reserved for production tests
internal signal processing in the receiver chain is performed
non-linearly which increases the operating distance in communication
modes at 106 kBd
Remark: due to non-linearity, the effect of the RxThresholdReg
register’s MinLevel[3:0] and the CollLevel[2:0] values is also
non-linear
reserved for production tests
enables the digital self test
the self test can also be started by the CalcCRC command; see
Section 10.3.1.4 on page 70
the self test is enabled by 1001b
Remark: for default operation the self test must be disabled by 0000b
R/W
115232
5
5
4
4
Version[7:0]
R
3
3
AnalogSelAux2[3:0]
2
2
Contactless reader IC
R/W
MFRC523
© NXP B.V. 2010. All rights reserved.
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