mc9s12ne64 Freescale Semiconductor, Inc, mc9s12ne64 Datasheet - Page 533

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mc9s12ne64

Manufacturer Part Number
mc9s12ne64
Description
Hcs12 Microcontrollers Microcontroller
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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A.15.1.4
Erasing a NVM block takes:
The setup times can be ignored for this operation.
A.15.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at < 2 ppm defects over lifetime
at the operating conditions noted.
A program/erase cycle is specified as two transitions of the cell value from erased → programmed →
erased, 1 → 0 → 1.
Freescale Semiconductor
1
2
3
4
5
6
Conditions are shown in
Num
Restrictions for oscillator in crystal mode apply!
Minimum programming times are achieved under maximum NVM operating frequency f
frequency f
Maximum erase and programming times are achieved under particular combinations of f
Minimum Erase times are achieved under maximum NVM operating frequency f
Minimum time, if first word in the array is not blank
Maximum time to complete check on an erased block.
1
2
3
4
5
6
7
8
9
C
D
D
D
D
D
D
P
P
P
NVM Reliability
Mass Erase
bus
.
External oscillator clock
Bus frequency for programming or erase
operations
Operating frequency
Single Word programming time
FLASH burst programming consecutive word
FLASH burst programming time for 32 words
Sector erase time
Mass erase time
Blank check time FLASH per block
Table A-4
unless otherwise noted
Table A-25. NVM Timing Characteristics
Rating
t
MC9S12NE64 Data Sheet, Rev. 1.1
mass
20000
---------------------
f
NVMOP
Symbol
f
f
NVMOSC
f
NVMBUS
t
t
NVMOP
t
t
bwpgm
swpgm
t
brpgm
mass
check
1
t
era
678.4
NVMOP
20.4
100
Min
46
20
11
150
0.5
1
2
4
5
4
FLASH NVM Electrical Characteristics
2
2
.
NVMOP
NVMOP
Typ
and bus frequency f bus.
and maximum bus
1035.5
32778
74.5
26.7
Max
133
50
200
31
3
1
3
3
3
3
6
Unit
MHz
MHz
kHz
t
ms
ms
µs
µs
µs
cyc
533

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