SAM9G10 Atmel Corporation, SAM9G10 Datasheet - Page 55

• Manufacturer Part Number: SAM9G10
• Manufacturer: Atmel Corporation

Specifications of SAM9G10

• Flash (kbytes): 0 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 266 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 1
• Uart: 4
• Ssc: 3
• Sd / Emmc: 1
• Graphic Lcd: Yes
• Video Decoder: No
• Camera Interface: No
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 16
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.08 to 1.32
• Fpu: No
• Mpu / Mmu: No/Yes
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12.3.2
12.4
6462B–ATARM–6-Sep-11
Debug and Test Pin Description
Test Environment
Figure 12-3 on page 55
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
NTRST
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
AT91SAM9G10-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
Interface
AT91SAM9G10
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Test Reset Signal
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
JTAG
Chip n
ICE and JTAG
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Input/Output
Tester
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
SAM9G10
Active Level
High
Low
Low
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