SAM9G10 Atmel Corporation, SAM9G10 Datasheet - Page 57

• Manufacturer Part Number: SAM9G10
• Manufacturer: Atmel Corporation

Specifications of SAM9G10

• Flash (kbytes): 0 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 266 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 1
• Uart: 4
• Ssc: 3
• Sd / Emmc: 1
• Graphic Lcd: Yes
• Video Decoder: No
• Camera Interface: No
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 16
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.08 to 1.32
• Fpu: No
• Mpu / Mmu: No/Yes
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

12.5.4
12.5.5
12.5.5.1
6462B–ATARM–6-Sep-11
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
JTAG Boundary-scan Register
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two Peripheral DMA Controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The SAM9G10 Debug Unit Chip ID value is 0x0199 03A1 on 32-bit width.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1
JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be per-
formed after JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
The Boundary-scan Register (BSR) contains 484 bits that correspond to active pins and associ-
ated control signals.
Each SAM9G10 input/output pin corresponds to a 3-bit register in the BSR. The OUTPUT bit
contains data that can be forced on the pad. The INPUT bit facilitates the observability of data
applied to the pad. The CONTROL bit selects the direction of the pad.
Table 12-2.
Bit Number
483
482
481
480
479
478
477
476
475
474
SAM9G10 JTAG Boundary Scan Register
NRD/NWR0/NWR1/NWR3
NCS0/NCS1/NCS2/NCS3
Pin Name
A[22:16]
NCS0
A[7:0]
NCS1
A18
A19
A20
A21
A22
Pin Type
OUT
OUT
OUT
OUT
OUT
OUT
OUT
Associated BSR Cells
CONTROL
CONTROL
CONTROL
SAM9G10
OUTPUT
OUTPUT
OUTPUT
OUTPUT
OUTPUT
OUTPUT
OUTPUT
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