MT29F1G08ABADAWP-IT:D Micron Technology Inc, MT29F1G08ABADAWP-IT:D Datasheet - Page 76

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MT29F1G08ABADAWP-IT:D

Manufacturer Part Number
MT29F1G08ABADAWP-IT:D
Description
Manufacturer
Micron Technology Inc
Datasheet

Specifications of MT29F1G08ABADAWP-IT:D

Lead Free Status / Rohs Status
Compliant

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0
PDF: 09005aef83e5ffed
m68a.pdf – Rev. D 06/10 EN
Notes:
Note:
Table 19: Capacitance
Table 20: Test Conditions
Description
Input capacitance
Input/output capacitance (I/O)
Parameter
Input pulse levels
Input rise and fall times
Input and output timing levels
Output load
1. These parameters are verified in device characterization and are not 100% tested.
2. Test conditions: T
1. These parameters are verified in device characterization and are not 100% tested.
C
= 25°C; f = 1 MHz; V
76
3.3V
1.8V
Symbol
C
C
Micron Technology, Inc. reserves the right to change products or specifications without notice.
IO
IN
1Gb x8, x16: NAND Flash Memory
IN
= 0V.
1 TTL GATE and CL = 30pF
1 TTL GATE and CL = 30pF
Max
10
10
Electrical Specifications
0.0V to V
Value
V
5ns
CC
/2
© 2010 Micron Technology, Inc. All rights reserved.
CC
Unit
pF
pF
Notes
1, 2
1, 2
Notes
1
1

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