AT90USB647-MU Atmel, AT90USB647-MU Datasheet - Page 334

• Manufacturer Part Number: AT90USB647-MU
• Description: MCU, 8BIT, 64K FLASH, USB, 64QFN
• Manufacturer: Atmel

Specifications of AT90USB647-MU

• Controller Family/series: AT90
• No. Of I/o's: 48
• Eeprom Memory Size: 2KB
• Ram Memory Size: 4KB
• Cpu Speed: 16MHz
• No. Of: RoHS Compliant
• Core Size: 8bit
• Program Memory Size: 64KB
• Oscillator Type: External, Internal
• Package: 64QFN EP
• Device Core: AVR
• Family Name: AT90
• Maximum Speed: 20 MHz
• Ram Size: 4 KB
• Operating Supply Voltage: 3.3|5 V
• Data Bus Width: 8 Bit
• Program Memory Type: Flash
• Number Of Programmable I/os: 48
• Interface Type: SPI/TWI/USART/USB
• On-chip Adc: 8-chx10-bit
• Operating Temperature: -40 to 85 °C
• Number Of Timers: 4
• Lead Free Status / Rohs Status: Details

26.3
334
TAP Controller
AT90USB64/128
Figure 26-2. TAP Controller State Diagram
The TAP controller is a 16-state finite state machine that controls the operation of the Boundary-
scan circuitry, JTAG programming circuitry, or On-chip Debug system. The state transitions
depicted in
transition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is Test-
Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
• At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register – Shift-IR state. While in this state, shift the four bits of the JTAG
instructions into the JTAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out on
the TDO pin. The JTAG Instruction selects a particular Data Register as path between TDI
and TDO and controls the circuitry surrounding the selected Data Register.
1
0
Figure 26-2
Test-Logic-Reset
Run-Test/Idle
0
depend on the signal present on TMS (shown adjacent to each state
1
1
0
Select-DR Scan
Capture-DR
Update-DR
Pause-DR
Exit1-DR
Exit2-DR
Shift-DR
1
0
0
1
0
1
1
0
1
1
0
0
1
0
Select-IR Scan
Capture-IR
Update-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
0
0
1
0
1
1
0
7593K–AVR–11/09
1
1
0
0