SAM9RL64 Atmel Corporation, SAM9RL64 Datasheet - Page 70

• Manufacturer Part Number: SAM9RL64
• Manufacturer: Atmel Corporation

Specifications of SAM9RL64

• Flash (kbytes): 0 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 240 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 118
• Ext Interrupts: 118
• Usb Transceiver: 1
• Usb Speed: Hi-Speed
• Usb Interface: Device
• Spi: 1
• Twi (i2c): 2
• Uart: 5
• Ssc: 2
• Sd / Emmc: 1
• Graphic Lcd: Yes
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 6
• Adc Resolution (bits): 10
• Adc Speed (ksps): 220
• Resistive Touch Screen: Yes
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 64
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.08 to 1.32
• Fpu: No
• Mpu / Mmu: No / Yes
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

13.4
13.5
13.5.1
13.5.2
6289D–ATARM–3-Oct-11
Debug and Test Pin Description
Functional Description
Test Pin
Embedded In-circuit Emulator
Table 13-1.
One dedicated pin, TST, is used to define the device operating mode. The user must make sure
that this pin is tied at low level to ensure normal operating conditions. Other values associated
with this pin are reserved for manufacturing test.
The ARM9EJ-S Embedded In-Circuit Emulator-RT is supported via the ICE/JTAG port. It is con-
nected to a host computer via an ICE interface. Debug support is implemented using an
ARM9EJ-S core embedded within the ARM926EJ-S. The internal state of the ARM926EJ-S is
examined through an ICE/JTAG port which allows instructions to be serially inserted into the
pipeline of the core without using the external data bus. Therefore, when in debug state, a store-
multiple (STM) can be inserted into the instruction pipeline. This exports the contents of the
ARM9EJ-S registers. This data can be serially shifted out without affecting the rest of the
system.
There are two scan chains inside the ARM9EJ-S processor which support testing, debugging,
and programming of the Embedded ICE-RT
port.
Embedded ICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the Embedded In-Circuit-Emulator-RT, see the ARM document:
ARM9EJ-S Technical Reference Manual (DDI 0222A).
Pin Name
NTRST
NRST
TST
TCK
TDI
TDO
TMS
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
Function
Test Reset Signal
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
ICE and JTAG
Debug Unit
Reset/Test
™
. The scan chains are controlled by the ICE/JTAG
AT91SAM9R64/RL64
Input/Output
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
Active Level
High
Low
Low
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