CDB5376 Cirrus Logic Inc, CDB5376 Datasheet - Page 101

EVALUATION BOARD FOR CS5376

CDB5376

Manufacturer Part Number
CDB5376
Description
EVALUATION BOARD FOR CS5376
Manufacturer
Cirrus Logic Inc
Datasheets

Specifications of CDB5376

Main Purpose
Seismic Evaluation System
Embedded
Yes, MCU, 8-Bit
Utilized Ic / Part
CS3301A, CS3302A, CS4373A, CS5372A, CS5376A
Primary Attributes
Quad Digital Filter
Secondary Attributes
Graphical User Interface, SPI™ & USB Interfaces
Processor To Be Evaluated
CS330x, CS4373A, CS537x
Interface Type
USB
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Contains lead / RoHS non-compliant
Other names
598-1778
23.2.15 SELFTEST : 0x2F
DS612F4
Bit definitions:
23:20 --
19:16 EU
(MSB) 23
DRAM3
DROM3
R/W
R/W
R/W
15
--
0
1
7
1
[3:0]
DRAM2
DROM2
R/W
R/W
R/W
22
14
reserved
Execution Unit Test
‘A’: Pass
‘F’: Fail
--
0
0
6
0
Figure 59. Self Test Result Register SELFTEST
DRAM1
DROM1
R/W
R/W
R/W
21
13
--
0
1
5
1
DRAM0
DROM0
15:12 DRAM
11:8
R/W
R/W
R/W
20
12
--
0
0
4
0
[3:0]
PRAM
[3:0]
PRAM3
PROM3
R/W
R/W
R/W
EU3
19
11
1
1
3
1
Data RAM Test
‘A’: Pass
‘F’: Fail
Program RAM Test
‘A’: Pass
‘F’: Fail
PRAM2
PROM2
R/W
R/W
R/W
EU2
18
10
0
0
2
0
PRAM1
PROM1
EU1
R/W
R/W
R/W
17
1
9
1
1
1
7:4
3:0
PRAM0
(LSB) 0
PROM0
DROM
[3:0]
PROM
[3:0]
EU0
R/W
R/W
R/W
16
0
8
0
0
Data ROM Test
‘A’: Pass
‘F’: Fail
Program ROM Test
‘A’: Pass
‘F’: Fail
DF Address: 0x2F
--
R
W
R/W
Bits in bottom rows
are reset condition
Not defined;
read as 0
Readable
Writable
Readable and
Writable
CS5376A
101

Related parts for CDB5376