PIC18F27J13-I/SP Microchip Technology, PIC18F27J13-I/SP Datasheet - Page 323

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PIC18F27J13-I/SP

Manufacturer Part Number
PIC18F27J13-I/SP
Description
IC PIC MCU 128KB FLASH 28SPDIP
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr

Specifications of PIC18F27J13-I/SP

Core Size
8-Bit
Program Memory Size
128KB (64K x 16)
Core Processor
PIC
Speed
48MHz
Connectivity
I²C, LIN, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
22
Program Memory Type
FLASH
Ram Size
3.8K x 8
Voltage - Supply (vcc/vdd)
2.15 V ~ 3.6 V
Data Converters
A/D 10x10b/12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Controller Family/series
PIC18
Cpu Speed
48MHz
Digital Ic Case Style
DIP
Supply Voltage Range
1.8V To 5.5V
Embedded Interface Type
I2C, SPI, USART
Rohs Compliant
Yes
Core
PIC
Processor Series
PIC18F
Data Bus Width
8 bit
Maximum Clock Frequency
48 MHz
Data Ram Size
3.76 KB
On-chip Adc
Yes
Number Of Programmable I/os
2
Number Of Timers
8
Operating Supply Voltage
2.15 V to 3.6 V
Operating Temperature Range
- 40 C to + 85 C
A/d Bit Size
12 bit
A/d Channels Available
10
Height
3.43 mm
Interface Type
I2C, SPI, USART
Length
34.4 mm
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.15 V
Width
7.24 mm
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
MA180030 - BOARD DEMO PIC18F47J13 FS USBMA180029 - BOARD DEMO PIC18F47J53 FS USB
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
19.3.2
There is a small amount of capacitance from the
internal A/D Converter sample capacitor as well as
stray capacitance from the circuit board traces and
pads that affect the precision of capacitance
measurements.
capacitance can be taken by making sure the desired
capacitance to be measured has been removed. The
measurement is then performed using the following
steps:
1.
2.
3.
4.
5.
6.
where I is known from the current source measurement
step, t is a fixed delay and V is measured by performing
an A/D conversion.
This measured value is then stored and used for
calculations of time measurement or subtracted for
capacitance measurement. For calibration, it is
expected that the capacitance of C
approximately known. C
An iterative process may need to be used to adjust the
time, t, that the circuit is charged to obtain a reasonable
voltage reading from the A/D Converter. The value of t
may be determined by setting C
value, then solving for t. For example, if C
theoretically calculated to be 11 pF, and V is expected
to be 70% of V
or 63 s.
See
capacitance calibration.
 2010 Microchip Technology Inc.
Initialize the A/D Converter and the CTMU.
Set EDG1STAT (= 1).
Wait for a fixed delay of time t.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the stray and A/D sample capacitances:
Example 19-3
C
OFFSET
CAPACITANCE CALIBRATION
(4 pF + 11 pF) • 2.31V/0.55 A
DD
, or 2.31V, then t would be:
A
=
for a typical routine for CTMU
C
measurement
STRAY
AD
is approximately 4 pF.
+
C
OFFSET
AD
=
STRAY
of
to a theoretical
I t 
 V 
the
+ C
STRAY
AD
stray
Preliminary
is
is
PIC18(L)F2X/4XK22
DS41412D-page 323

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