AT91SAM7SE256-CU Atmel, AT91SAM7SE256-CU Datasheet - Page 51

• Manufacturer Part Number: AT91SAM7SE256-CU
• Description: IC ARM7 MCU FLASH 256K 144-LFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7SE256-CU

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: EBI/EMI, I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 88
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 144-LFBGA
• Processor Series: AT91SAMx
• Core: ARM7TDMI
• Data Bus Width: 32 bit
• Data Ram Size: 32 KB
• Interface Type: EBI, SPI, TWI, USART
• Maximum Clock Frequency: 48 MHz
• Number Of Programmable I/os: 32
• Number Of Timers: 3
• Operating Supply Voltage: 1.8 V to 3.3 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, KSK-AT91SAM7S-PL, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP, AT91SAM7SE-EK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit
• For Use With: AT91SAM7SE-EK - EVAL BOARD FOR AT91SAM7SEAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: AT91SAM7SE256-CJ; AT91SAM7SE256-CJ

12.3.2
12.4
6222F–ATARM–14-Jan-11
Debug and Test Pin Description
Test Environment
Figure 12-3
ter. In this example, the “board in test” is designed using a number of JTAG-compliant devices.
These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
shows a test environment example. Test vectors are sent and interpreted by the tes-
Debug and Test Pin List
AT91SAM7SExx-based Application Board In Test
Connector
ICE/JTAG
AT91SAM7SExx
Interface
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
SAM7SE512/256/32 Preliminary
Chip n
ICE and JTAG
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
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