AT32UC3L064-D3HES ATMEL [ATMEL Corporation], AT32UC3L064-D3HES Datasheet - Page 637

• Manufacturer Part Number: AT32UC3L064-D3HES
• Manufacturer: ATMEL [ATMEL Corporation]

Figure 27-3. The Filtering Algorithm
27.7
27.8
32099D–06/2010
Peripheral Event Triggers
AC Test mode
0
Peripheral events from other modules can trigger comparisons in the ACIFB. All channels that
are set up in Event Triggered Single Measurement Mode will be started simultaneously when a
peripheral event is received. Channels that are operating in Continuous Measurement Mode or
User Triggered Single Measurement Mode will be unaffected by the received event. The soft-
ware can still operate these channels independently of channels in Event Triggered Single
Measurement Mode.
A peripheral event will trigger one or more comparisons, in normal or window mode.
By writing the Analog Comparator Test Mode (CR.ACTEST) bit to one, the outputs from the ACs
are overridden by the value in the Test Register (TR), see
development.
”Result=0"
UNCHANGED
HYS
Result =
2
FLEN
2
HYS
”Result=1"
AT32UC3L016/32/64
Figure
27-1. This is useful for software
2
FLEN
637